Probing C₈₄-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

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11.7K Views

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13:58 min

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September 28th, 2016

DOI :

10.3791/54235-v

September 28th, 2016

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Mon-Shu Ho¹, Chih-Pong Huang², Jyun-Hwei Tsai³, Che-Fu Chou¹, Wen-Jay Lee³

¹Department of Physics and Institute of Nanoscience, National Chung Hsing University, ²Metallurgy Section, Materials & Electro-Optics Research Division, National Chung-Shan Institute of Science and Technology, ³National Center for High-Performance Computing

Podsumowanie

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C84 embedded Si Substrate

Scanning Probe Microscopy

Molecular Dynamics

Silicon 111 Substrate

Electronic Properties

Optoelectronic Properties

Mechanical Properties

Magnetic Properties

Field Emission Properties

Rozdziały w tym wideo

0:05

Title

1:21

Fabrication of Hexagonal-closed-packaged (HCP) Overlayer of C₈₄ in Si Substrate

2:57

Measurements of Electronic Properties of C₈₄-embedded Si Substrate

5:07

Measurements of Surface Magnetism

6:17

Measurements of Nanomechanical Properties by AFM

6:49

Measurement of Nanomechanical Properties by Molecular Dynamics Simulation

11:05

Results: Characterization of C₈₄-embedded Silicon Substrate by Nanomeasurements and Molecular Dynamic Simulation

12:46

Conclusion

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