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Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

3.2K Views

08:20 min

October 25th, 2021

DOI :

10.3791/62886-v

October 25th, 2021


Explore More Videos

3D correlative FIB Milling

Chapters in this video

0:04

Introduction

0:36

Cryo-Fluorescence Light Microscopy (Cryo-FLM) of Plunge‐Frozen Grids with Cells

1:51

Focused Ion Beam (FIB) Milling

5:47

Correlative Transmission Electron Microscopy (TEM)

7:02

Results: Visualizing the Endocytic Protein Deposit in the Cell with Cryo‐ET

7:38

Conclusion

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