A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
9.1K Views
•
07:15 min
•
June 2nd, 2017
DOI :
June 2nd, 2017
•Chapters in this video
0:05
Title
0:45
Microfabrication of Silicon Frames
2:13
Laser Patterning of Metal Copper Specimens
3:38
Microdevice-based Electromechanical Testing Systems (MEMTS) Assembly
4:38
In Situ Transmission Electron Microscopy (TEM) Experiments
5:52
Results: In Situ Electromechanical Characterization of a Single-crystal Copper Specimen
6:50
Conclusion
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